Product Short Description
Product Name: WAVECREST DTS-2079 Digital Timing Analyzer
Product Overview: A Digital Timing Analyzer (DTS) that provides picosecond accuracy, femtosecond resolution, low noise floor, and high speed for the rapid characterization of semiconductor devices in the time, frequency, and modulation domains. Winner of the “Best in Test” award from Test & Measurement World.
Description
Timing Characteristics:
- Frequency Range: 0.4 Hz to 1630 MHz
- Maximum Data Rate: 3.2 Gbps
- Minimum Pulse Width: 300 ps
- Jitter Noise Floor: < 6 ps rms (3 ps rms typical at calibration frequency)
- Jitter Measurement Accuracy: < 2 ps
- Hardware Resolution: 800 fs
- Time Measurement Range: ±2.5 s
- Frequency Measurement Range: 1 PPM
- Time Base Accuracy: 1 PPM
- Time Base Stability (Short-Term Aging): 5 × 10⁻¹¹
Voltage Performance:
- Input Range: ±1.1 V
- VREF Accuracy: ±(1.0 mV + 0.05% of setting)
- VREF Resolution: 150 µV
Structural & Material Features: Designed for both standalone benchtop operation and integration into ATE (Automated Test Equipment) systems. Unlike conventional digital sampling oscilloscopes (DSO), the DTS provides direct, real-time measurements without the errors of sampling and conversion.
Working Principle: Operates either synchronously or asynchronously to directly measure timing parameters — pulse width, phase, propagation delays, rise/fall times, and period/frequency jitter components — without sampling and conversion errors associated with DSOs.
Application Scenarios: Design and characterization of high-frequency clocks and data communication devices; semiconductor device characterization; ATE production test with 100% correlation between characterization and final test.
Usage Notes: The DTS-2079 permits 100% correlation of characterization and final test by directly supporting both applications. Built-in calibration options can be user-initiated at any time to maintain long-term measurement accuracy and linearity.
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