Technical Specifications
- Channels: 24 bidirectional digital I/O
- Data Rate: High-speed HSDIO operation
- Per-Pin Features: PPMU, active load
- Programmable Logic Voltage: Supported
- Trigger: PFI and PXI trigger lines
- Bus: PXI Express
- Operating Temperature: 0 °C to 55 °C typical PXI range
Functional Features
- Per-pin parametric measurement unit
- Per-pin force voltage or measure current
- Active load for digital pin testing
- High-speed pattern generation and capture
- PXI trigger and clock synchronization
- Configurable logic levels and timing
Working Principle
Each digital pin can act as a driver, comparator, or parametric measurement node. The module generates test vectors, compares responses, and uses the PPMU to force or measure voltage and current at the device pin.
Application Scenarios
- Semiconductor digital device test
- IC validation
- Pin-level leakage and continuity test
- FPGA and ASIC verification
- Automated digital production test
- Device characterization
Installation Requirements
- Install in PXI Express chassis slot
- Use matched digital interconnect and fixture
- Define logic threshold and PPMU range before test
- Install NI-HSDIO driver
- Calibrate or verify instrument before critical measurements
Usage Notes
- Do not exceed per-pin voltage or current limits
- Configure PPMU range before forcing current
- Protect pins from short circuits and overvoltage
- Use proper termination for high-speed signals
- Avoid undefined logic thresholds during device power-up
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